- Why Does Material R&D Need a “Microscopic Composition Detective”?
Finding 0.05mm metal impurities on semiconductor wafers, detecting micron-level cracks in aerospace aluminum welds, or locating nano-scale inclusions in ceramic composites… traditional microscopes only “see the surface.” In contrast, Micro Laser-Induced Breakdown Spectroscopy (Micro-LIBS) not only reveals defects but also identifies their composition, making it the “X-ray vision” of industrial quality inspection and scientific research!
- Micro-LIBS Analyzer: Redefining Microscopic Composition Analysis
- Key Specifications at a Glance
– Laser Wavelength: 1064nm (stable energy, adaptable to various materials)
– Laser Spot Diameter: 50μm (half the width of a human hair, precisely targeting micron-scale defects)
– Focal Range: 10-50mm (adjustable for ultra-close observation to area scanning)
– Detection Capability: Works for alloys & non-metals, spectral range 190-700nm (covering all periodic table elements)
- How It Works: See How Lasers “Make Materials Talk” in 3 Seconds
– High-Energy Pulse Focus
A 1064nm laser instantly bombards the sample surface, vaporizing a micron-scale area into a “plasma fireball”.
– Spectral Fingerprint Analysis
As the plasma cools, it emits element-specific spectral signatures – like a unique “chemical ID card.”
– Micron-Level Positioning
Paired with a microscopic vision system, defect locations and composition data are matched in real time – no more blind testing!
III. Four Core Advantages: Solving Industry’s “Bottleneck” Inspection Challenges
- Micron-Level “Magnifying Glass”: Defects as small as 0.05mm
– weld pores, casting slag, semiconductor wafer contaminants are precisely captured. Ideal for aerospace, chip manufacturing, and other high-precision fields.
- Trace Impurity “Scanner”:
Detects elements at ppm-level concentrations, such as Mg segregation in aluminum alloys or metal residues in lithium battery separators, eliminating hidden risks at the source.
- 3-Second Ultra-Fast Analysis:
No sample prep, instant results – supports real-time online monitoring, boosting inspection efficiency in automotive, photovoltaic materials, and more.
- Full-Element “X-ray Vision”:
Metals, ceramics, polymers…no matter how complex the material, 50+ elements are analyzed simultaneously, eliminating the need for multiple tests.
- Micro-LIBS Module: Flexible Integration, Turning Microscopes into “Composition Analyzers”
Two Operation Modes:
- Microscope Add-On:
Seamlessly integrates with industrial microscopes, preserving original functions at low upgrade costs.
- Standalone Unit:
Equipped with its own vision system and 3D-movable sample stage, usable in labs or production lines.
Upgrade your defect analysis with micron-level precision—Micro-LIBS brings the future of material inspection today!